Picture of Standard Ion beam analysis beam line
Current status:
AVAILABLE
Book | Log| 
Show/Collapse all

Responsibles
1st Responsible:
Daniel Primetzhofer
2nd Responsible:
Group:
Tandem Laboratory
Files
You must be logged in to view files.
Description

Accurate composition analysis using RBS, (ToF-)ERDA, PIXE, NRA etc. for depth profiling on nm to µm depth scales

Details
Tool name:
Standard Ion beam analysis beam line
Tool ID:
00255
Manufacturer:
TBD
Model:
TBD
Instructors & Licensed Users

Instructors

Licensed Users

Tool Modes
You must be logged in to view tool modes.