UV/VIS/NIR Spectrophotometer with integrating sphere. Configured for the measurements of thin films, thick films, foils, coatings, etc.
General purpose:
Measurement of diffuse, specular and total transmittance and reflectance.
Price/hour
FTF user: free
Department of Materials Science and Engineering user: free
Other users, including from other departments at UU: 650h SEK.