Picture of AFM-MFM
Current status:
AVAILABLE
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Group:
Solid State Physics
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The Dimension Icon is high resolution and low noise level Scanning Probe Microscope (SPM). It is a versatile closed loop SPM system with some of the new advanced features:

  • ScanAsyst brings brings ease of use, performance, functionality, and SPM accessibility to nanoscale researchers
  • Proprietary sensor design achieves closed-loop performance with open-loop noise levels for the highest resolution ever on a large-sample SPM
  • New-design XYZ closed-loop head delivers higher scan speed, without loss of image quality, enabling greater throughput for data collection
  • Latest version of NanoScope software offers an intuitive workflow and default experiment modes that simplifies advanced SPM processes by using preconfigured settings
  • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation

General purpose: 

Atomic Force Microscopy (AFM)

- Contact Mode
- Tapping Mode
- Fluid Imaging

Magnetic Force Microscopy (MFM)

 

Tool name:
AFM-MFM
Tool ID:
00176
Manufacturer:
BRUKER
Model:
Dimension Icon ICON4-SYS

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